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Title: | Designing and Building-In Reliability in Advanced Microelectronic Assemblies and Structures |  |
| Author: | John W. Evans, ITI | ||
| Size: | 143.4 KB | ||
| Date Published: | |||
Summary
New techniques in electronics require that product development embrace the paradigms of design for reliability and built-in reliability. These paradigms require effective measures to create robust designs and manufacturing processes.